Wafer Management System
- ID number read location and label attach location can be set arbitrarily
Wafer ID read location and barcode attach location can be set with ease by using a X, Y, Θ robot.
- High-Performance Vision System
High performance, high speed system is available for requirements with better image processing capabilities. Provides great precision of wafer ID recognition even to images with noise.
- Easily Installed in Existing Lines
As a stand-alone system, it is easy to install into an existing line.
- Options
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- Host Communication Function
(Communication Format: Conforms to SECS-I and HSMS/Software: Conforms to GEM)
ISO 9001 : 2008
Certificate JP08/060975
Lintec Corporation
Agatsuma Plant
Technology Administration
R&D Div. Research Laboratory
Planning Dept.
Business Administration Div.
Advanced Materials Operations.
ISO 9001 : 2008
Certificate JQA-QM7787
Lintec Corporation
Ina Technology Center
ISO 14001 : 2004
Certificate JP08/070484
Lintec Corporation
(Includes Agatsuma Plant, Ina Technology Center, Research Laboratory, and others)
At Lintec's Research Laboratory (Saitama Prefecture) and Agatsuma Plant (Gunma Prefecture), where tapes for semiconductor manufacturing are developed and manufactured, and at the Ina Technology Center (Saitama Prefecture) where related equipment are developed and manufactured, certification has been obtained for the ISO 9001 quality management system and the ISO 14001 environment management system.
